| Course Type | Elective Course |
|---|
| Course Level | Master's Degree With Thesis |
|---|
| Year of Study | - |
|---|
| Semester | - |
|---|
| ECTS | 10 |
|---|
| Name of Lecturer(s) |
- |
| Learning Outcomes |
At the end of this course, the students;
- Learn basic definitions and concepts related with microscope.
- Learn basic parts and principles of optical microscope.
- Learn relatively new and advanced microscopic techniques.
- Comprehend basic electronic circuits related parts of advanced microscopes.
- Understand application of advanced microscopes as a nanotool.
- Learn sample preparation for each technique.
|
| Mode of Delivery | Face to face |
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| Prerequisites | No |
|---|
| Recommended Optional Programme Components | None |
|---|
| Course Description | Optical microscope: pats, principles, usage field and some specialities., Scanning Electron Microscopes (SEM, TEM): basic principles and their applications., Laser Confocal Microscope: basic principles and applications, Scanning Probe Microscopes (STM, AFM, SHPM, etc.) principles, applications and usage as nanotool., Advantages and disadvantages of each system., Limitations and capabilities., Sample preparations for each technique. |
|---|
| Course Contents |
| WEEK |
TOPICS |
|
1st Week |
Fundamentals of Light Microscopy |
|
2nd Week |
Application Fields of Light Microscopy |
|
3rd Week |
Fundamentals of Fluorescence Microscopy |
|
4th Week |
Principles of Laser Confocal Microscope |
|
5th Week |
Advantages of Confocal Microscope |
|
6th Week |
Principles of Electron Microscope |
|
7th Week |
Varieties of Electron Microscope |
|
8th Week |
Midterm Exam |
|
9th Week |
Sample Preparation for Electron Microscope |
|
10th Week |
Principles of Scanning Probe Microscopy |
|
11th Week |
Varieties of Scanning Probe Microscopy |
|
12th Week |
Usage of Scanning Probe Microscopes as Nanotool |
|
13th Week |
Usage of Scanning Probe Microscopes as Nanotool |
|
14th Week |
Sample Preparation for Scanning Probe Microscopes, Special Applications of Scanning Probe Microscopes |
|
| Recommended or Required Reading | (1)Fundamentals of Light Microscopy and Electronic Imaging , Douglas B. Murphy, Wiley-Liss, 2001.
(2)Stephen W. Paddock, Confocal Microscopy Methods and Protocols, Humana, P.J. Goodhew, Electron Microscopy and Analysis, Taylor & Francis, 2001.
|
|---|
| Planned Learning Activities and Teaching Methods |
- Lecture
- Discussion
- Questions/Answers
- Practice
|
|---|
| Assessment Methods and Criteria |
|
Quantity |
Percentage (%) |
| Mid-term |
1 |
30 |
| Assignment |
1 |
10 |
| Quiz |
1 |
10 |
| Project |
1 |
10 |
| Total(%) |
|
60 |
| Contribution of In-term Studies to Overall Grade(%) |
|
60 |
| Contribution of Final Examination to Overall Grade(%) |
|
40 |
| Total(%) |
|
100 |
|
| ECTS Allocated Based on Student Workload |
| Activities |
Quantity |
Duration (Hour) |
Total Workload (Hour) |
| Midterm exam |
1 |
72 |
72 |
| Preparation for Quiz |
1 |
12 |
12 |
| Individual or group work |
2 |
3 |
6 |
| Preparation for Final exam |
1 |
24 |
24 |
| Course hours |
14 |
3 |
42 |
| Preparation for Midterm exam |
1 |
11 |
11 |
| Laboratory (including preparation) |
0 |
0 |
0 |
| Final exam |
1 |
96 |
96 |
| Homework |
1 |
12 |
12 |
| Project |
1 |
12 |
12 |
| Total Work Load | 287 |
| Total Work Load / 30 (h) | 9.56 |
| ECTS Credit of the Course | 10 |
|
| Language of Instruction | Turkish |
|---|
| Work Placement(s) | No |
|---|
